Resistive Random Access Memory (ReRAM): A Metal Oxide Memory Cell

نویسندگان

  • Hiro Akinaga
  • Hisashi Shima
چکیده

We review the recent progress in the ReRAM technology, one of the most promising emerging nonvolatile memories, in which both electronic and electrochemical effects play important roles in the nonvolatile functionalities. We first provide a brief historical overview of the research in this field. We also provide a technological overview and the epoch-making achievements, followed by an account of the current understanding of both bipolar and unipolar ReRAM operations. Finally, we summarize the challenges facing the ReRAM technology as it moves toward the beyond-2X-nm generation of nonvolatile memories and the so-called beyond-CMOS device. Index terms Electrochemical devices, Metal-insulator-metal devices, Nonvolatile memories, Resistance switching

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تاریخ انتشار 2010